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Kalrez® 6375UP

Sold by DuPont
Polymer Name: Perfluoroelastomer (FFKM)
Physical Form: Seals
Features: Chemical Resistant, General Purpose
End Uses: Semiconductor Applications, Pump Parts, General Purpose
Color: Black
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TypeDocument Name
Other
Kalrez® Safe Handling Guidelines (Japanese)
Kalrez® Safe Handling Guidelines (Japanese)
Other
Brochure
Kalrez® - Contamination considerations for perfluoroelastomer seals used in deposition processes
Kalrez® - Contamination considerations for perfluoroelastomer seals used in deposition processes
Brochure
Brochure
Kalrez® Brochure
Kalrez® Brochure
Brochure
Brochure
Perfluoroelastomer and Fluoroelastomer Seals for Photovoltaic Cell Manufacturing Processes
Perfluoroelastomer and Fluoroelastomer Seals for Photovoltaic Cell Manufacturing Processes
Brochure
Other
Kalrez® Guide for Safety in Handling Kalrez® Perfluoroelastomer Parts
Kalrez® Guide for Safety in Handling Kalrez® Perfluoroelastomer Parts
Other
Other
Kalrez® Perfluoroelastomer Parts
Kalrez® Perfluoroelastomer Parts
Other
Technical Data Sheet
Kalrez® 6375UP Technical Data Sheet
Kalrez® 6375UP Technical Data Sheet
Technical Data Sheet
Brochure
Kalrez® Perfluorelastomerteile (German)
Kalrez® Perfluorelastomerteile (German)
Brochure
Brochure
Kalrez® Spectrum™ (German)
Kalrez® Spectrum™ (German)
Brochure
Brochure
Kalrez® Spectrum™ (Spanish)
Kalrez® Spectrum™ (Spanish)
Brochure
Brochure
Kalrez® Spectrum™ (French)
Kalrez® Spectrum™ (French)
Brochure
Other
Kalrez® Semiconductor Selector Guide
Kalrez® Semiconductor Selector Guide
Other

Knowde Enhanced TDS

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Identification & Functionality

Chemical Family
Technologies
Chemical Contamination (anions and ToCs)

Two of the major sources of contamination in semiconductor processes are trace elements of unwanted chemicals (anions) and organic contaminants (TOCs). Process chemicals and process water can become contaminated and interfere with wafer processing. Chlorine (i.e., chloride ion) is such a contaminant and is rigorously controlled in process chemicals. In UPDI systems, TOCs can adhere to wafer surfaces and adversely affect oxide quality or film quality. Elastomeric seals can be a source of this contamination. DuPont has developed products to minimize the potential for chemical and organic contamination.

DuPont Kalrez 6375UP Chemical Contamination (anions and ToCs)

Kalrez® 6375UP Features & Benefits

Materials Features
Chemical Resistant,General Purpose

Applications & Uses

Properties

Color
Physical Form
Mechanical Properties
ValueUnitsTest Method / Conditions
Modulus (at 100% Elongation)9.1MPaASTM D 412
Tensile Strength15.2MPaASTM D 412
Elongation (at Break)160%ASTM D 412
Hardness (Shore A)75-ASTM D 2240
Compression Set (Pellet Type 1, at 204°C, 70h)24%ASTM D 395B
Compression Set (O-Ring AS568-214, at 204°C, 70h)25%ASTM D 1414
Typical Properties
ValueUnitsTest Method / Conditions
Maximum Service Temperature ¹275°C-
Lowest Service Temperature ¹-20°C-
Thermal Properties
ValueUnitsTest Method / Conditions
Glass Transition Temperature (at 10°C/min)-3.8°CASTM D 3418
Coefficient of Linear Thermal Expansion2.89E-4/°CISO 11359-1/-2
Retraction Temperature (TR-10)-3°CASTM D 1329
Other Properties
ValueUnitsTest Method / Conditions
Density1.99g/cm³ISO 1183
Note
  • [1]: DuPont proprietary test method; useful temperature range may vary with seal design and application specifics
Chemical Resistance

Kalrez® Offers Excellent Resistance to Chemical Attack

For many applications, low volume swell of elasto mers is critical for proper equipment operation. Excessive swell may cause permanent seal failure due to equipment hang-up, extrusion, etc. While other physical property testing may be needed to adequately define product performance in a particular application, volume swell is an excellent indicator of resistance to chemical attack. The following data represents a summary of internal and external compatibility tests performed to determine the volume swell of products suggested for semi conductor wet process environments.

Immersion Chemistry

Exposure Conditions

Kalrez® 6375UP

Kalrez® 4079UP Kalrez® 1050UP
UPDI Water

85°C, 30 days

0.7 2.3 5.5
Piranha

25°C, 30 days

0.1 0.1 0.1

SC-1

25°C, 30 days

0.6 1.1 0.6

SC-2

25°C, 30 days

0.1 0.1 0.2

49% HF

25°C, 30 days

2.8 0.6 1.8

Ammonium Hydroxide

100°C, 7 days

2.6 9.8 Not Tested

Sulfuric Acid (H2SO4)

120°C, 30 days

1.3

0.8

2.8

Nitric Acid (HNO3)

85°C, 7 days

2.1 1.5 Not Tested

Phosphoric/Acetic/Nitric Acid

60°C, 28 days

1.0 1.0 Not Tested

Hydrofluoric Acid/HNF4

60°C, 28 days

0.0 1.0 Not Tested

Hydrochloric, Nitric Acid and H20

60°C, 28 days

5.0

6.0 Not Tested

n-Methylpyrrolidone

80°C, 7 days

2.0

2.4

3.2

Dimethyl Acetimide

80°C, 7 days

2.4 4.0

4.4

ACT 690C™1

95°C, 10 days

1.5 7.9

2.0

ACT-NP870™1

80°C, 10 days

2.0 6.2 6.2

ACT 935™1

ACT 935

1.6 5.1 1.8

ACT NE-14™1

25°C, 10 days

0.0 0.0 0.3

ACT CMI™1

80°C, 10 days

2.7 6.5 5.2
EKC265™2

75°C, 7 days

1.0 2.8 0.7

EKC830™2

75°C, 7 days

3.1

10.0

10.1

EKC4000™ PCT2

75°C, 7 days

0.7 2.8 2.5

PRS-1000® 3

95°C, 10 days

1.5 7.9 2.0

PRS-3000™3

80°C, 10 days

2.0 6.2 2.0

ALEG™310^3

80°C, 10 days

1.6 5.1 1.8

REZI™ 28^3

80°C, 10 days

2.7 6.5 5.2

Technical Details & Test Data

Metallic Ion Contamination

Process chemicals can cause metallic ions to leach out of seal materials. These metallic ions, depending on type and quantity, can alter electrical properties and cause device failure to occur. Below is a summary of total metallic extractables after immersion of O-rings in various cleaning and wafer preparation process chemicals. Kalrez® 6375UP has an excellent balance of chemical resistance and low metallic extractables in a variety of process fluids.

DuPont Kalrez 6375UP Metallic Ion Contamination

Kalrez® 6375UP
DuPont